Online Calculators for STEM-EELS

Acceleration voltage:
[keV]
beta (v/c):
Electron wavelength:
[Å]
Momentum transfer:
[mrad]
=
[Å-1]
Energy loss:
[eV]
Characteristic half-angle θE =
[mrad]
Bethe ridge cuttoff θr =
[mrad]
Formula:
Convergence half-angle:
[mrad]
Acceptance half-angle:
[mrad]
[Å3]
Formula per unit cell:
[g/cm3]
Diffraction limited probe:
[Å]
Core Loss Edges (10–3000 eV)
El Edge Onset (eV)
Bold = strongest edge  |  Source: LBNL XDB
Inelastic Delocalization
Inelastic Mean Free Path
Knock-on Damage (threshold ~25 eV)

[mrad]
[mrad]
[mrad]
[mrad]
EELS ZLP Intensity

This is a web-based tool for simulating some useful parameters for a scanning transmission electron microscope.

The IMFP calculator codes were modified from Dr. A. Husain's codes, which were based on the Matlab code of Dr. R. Egerton.
Knock-on damage threshold calculations were adapted from Egerton, Li and Malac, Radiation Damage in the TEM and SEM, Micron 35 399–409 (2004).
The delocalization calculator is based on the R.F. Egerton's Electron Energy-loss Spectroscopy in the Electron Microscope, Sec.3.11.
The EELS ZLP simulation is based on Dr. Y. Guo's Github repository, and the details can be found in the related publication. The definitions of the aberration coefficients Enm and their corresponding angles θnm can be found here.
Electron binding energies from LBNL X-Ray Data Booklet, Table 1-1.

Webpage maintained by Sean Kung at the University of British Columbia.